Hitachi SU7000

For those seeking to explore materials at the frontier of modern science, the Hitachi SU7000 Field Emission SEM provides high-resolution nanoscale imaging.

For those seeking to explore materials at the very frontier of modern science, the Hitachi SU7000 Field Emission SEM provides high-resolution, nanoscale imaging, and with the addition of powerful Oxford Energy Dispersive X-ray Spectroscopy (EDS) and Electron Backscatter Diffraction (EBSD) detectors, researchers can probe the structure of new materials, inspect semiconductors, or reveal the intricate patterns of biological and geological samples.

The Oxford Ultimax 100 EDS provides fast and accurate analyses with software providing an array of additional processing techniques, including the ability to analyse multiple phases, and automated large area mapping to obtain data over multiple images in a single output.

With the addition of an Oxford Symmetry S3 EBSD, even more in-depth information can be gathered on the crystallographic structure of materials, revealing detailed information including phase distributions, grain size and grain orientation—data critical for materials engineering and academic research.

Our facility is equipped with the necessary sample preparation techniques required to prepare samples in cross-section, enabling the inner structures of a material to be observed. Critical for accurate results in EBSD, our Hitachi IM4000 ion mill is an essential final step in sample preparation to produce a material free of deformations and artifacts.

The high-end equipment and expertise in our facility enable us to support industry leaders and academic pioneers alike, turning bold ideas into tangible advancements.